Svitasheva S.N. Method of ellipsometry for the study of nanoscale films of diel
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- Start : Sun 11 May 2025 07:19:25 (IST)
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Svitasheva S.N. Method of ellipsometry for the study of nanoscale films of dielectrics, semiconductors and metals In Russian /Svitasheva S.N. Metod ellipsometrii dlya issledovaniya nanorazmernykh plenok dielektrikov, poluprovodnikov i metallov Novosibirsk Publishing House of Siberian Branch of Russian Academy of Sciences 2009. 268s.We have thousands of titles and often several copies of each title may be available. Please feel free to contact us for a detailed description of the copies available.SKUalb1e227d84d36400f4.
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| Listing Type | Gallery Listing |
| Listing ID# | 229507677 |
| Start Time | Sun 11 May 2025 07:19:25 (IST) |
| Close Time | Run Until Sold |
| Starting Bid | Fixed Price (no bidding) |
| Item Condition | Used |
| Bids | 0 |
| Views | 15 |
| Dispatch Time | Same Day |
| Quantity | 1 |
| Location | United States |
| Auto Extend | No |
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