Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits
- Condition : Used
- Dispatch : 2 Days
- Brand : Inst Of Engineering Technology
- ID# : 225579257
- Barcode : 9780863417450
- Start : Tue 31 Dec 2024 04:44:59 (CEST)
- Close : Run Until Sold
- Remain : Run Until Sold
for 1 item(s) 
Seller's Description
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits by Yichuang Sun. Published by Inst Of Engineering Technology in 2008. Paperback. ISBN:9780863417450
Listing Information
| Listing Type | Gallery Listing |
| Listing ID# | 225579257 |
| Start Time | Tue 31 Dec 2024 04:44:59 (CEST) |
| Close Time | Run Until Sold |
| Starting Bid | Fixed Price (no bidding) |
| Item Condition | Used |
| Bids | 0 |
| Views | 4 |
| Dispatch Time | 2 Days |
| Quantity | 1 |
| Location | Belgium |
| Auto Extend | No |
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